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Title Chemical structure of the ultra-thin SiO2/Si(100) interface: angle resolved Si 2p photoemssion study
Journal Physical Review B 63, 205310 (103 citations)
Author .H.Oh, H. W. Yeom, Y.Hagimoto, K.Ono, M.Oshima, N.Hirashita, M.Nywa, A.Toriumi and A.Kakizaki
Year 2001
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